plane 源码搜索结果, 第52页, Verysource

avitab：显示平板电脑以帮助VR使用的X-Plane插件 avitab：显示平板电脑以帮助VR使用的X-Plane插件
The Deployment of Routing Protocols in Distributed Control Plane... The Deployment of Routing Protocols in Distributed Control Plane of SDN
Multi-plane unequal interval imaging based on polarization multi... We propose an approach for imaging multi-plane-object where the image contents at different distant planes are recorded simultaneously in a single shot. The method is based on a compound quadratic distorted (QD) grating and the polarization multiplexing ...
Energy efficiency optimization-oriented control plane and user p... Energy efficiency optimization-oriented control plane and user plane adaptation with a frameless network architecture for 5G
Security Threats in the Data Plane of Software-Defined Networks ... .and speedy network innovations.by decoupling the control plane from the data.plane. However, the separation of the two planes. ... out that.attackers can launch various attacks from the data.plane against SDN, such as DoS attacks, topology.poisoning attacks, ...
Basal plane bending of 4H-SiC single crystals grown by sublimati... Basal plane bending of 4H-SiC single crystals grown by sublimation method with different seed attachment methods
landing of a crazy plane.flv landing of a crazy plane.flv
Out-of-plane focusing and manipulation of terahertz beams based ... Out-of-plane focusing and manipulation of terahertz beams based on a silicon/copper grating covered by monolayer graphene
In-Plane Anisotropic Raman Response and Electrical Conductivity ... The monoclinic m-MoO2 shows strong in-plane anisotropy that is essential to design anisotropic nanodevices. However, there ... the.anisotropy of m-MoO2 nanostructures. Here, the in-plane anisotropic Raman spectra and electrical conductivity of single-crystal ...
Measurement of in-plane deformations of microsystems by digital ... ... loads. We show interferometrical techniques like digital holography and speckle interferometry can be used for the measurement of in plane deformations of microsystems with nanometric accuracy and we give a description of the measurement uncertainties.

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