Experimental study on heavy ion single event effects in SOI SRAMs
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资源说明:Experimental study on heavy ion single event effects in SOI SRAMs,李永宏,贺朝会,64K silicon-on-insulator (SOI) SRAMs were exposed to different heavy ions, Cu, Br, I, Kr. Experiment results show that the heavy ion single event upset(SEU) threshold Linear Energy
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