Microstructuring of anti-reflection f ilm for HgCdTe/Si IRFPA with femtosecond laser pulse - 源码 - 源码 - 免费下载

Microstructuring of anti-reflection f ilm for HgCdTe/Si IRFPA with femtosecond laser pulse

文件大小： 2687k

源码售价： 10 个金币积分规则积分充值

资源说明：A systematic series of silicon (Si) wafer with microstructured anti-reflection film is prepared by femtosecond laser pulse. The dependence of the morphology and optical properties of the microstructured Si on the experimental parameters is thoroughly investigated. With the laser pulse duration of 40 fs, central wavelength of 800 nm, repetition rate of 250 kHz, laser pulse power of 300 mW, 250 \mu m/s scanning speed, and 2 \mu m of displacement between the parallel scans in the air, the quasiorde

部分文件列表（点击文件名可查看文件内容）

					
									本源码包内暂不包含可直接显示的源代码文件，请下载源码包。